Digital radio frequency V4 test solution combines stimulus and analysis capability

New Products |
By eeNews Europe

The new exerciser allows developers of radio-frequency integrated circuits (RF-ICs) and baseband integrated circuits (BB-ICs) as well as integrators of wireless handsets to characterise their devices using fewer probes. This capability enables faster testing and accelerated time to market. The DigRF V4 standard, driven by the Mobile Industry Processor Interface Alliance, describes a high-speed digital serial bus used between mobile baseband and RF chips.

DigRF V4 is a key enabling technology for LTE and WiMAX devices. Agilent’s N5343A DigRF V3/V4 exerciser offers new insights that reach from individual digital bits to IQ-modulated RF signals. The N5343A allows engineers to work in the domain (digital or RF) and abstraction level (physical or protocol layer) of their choice to quickly characterise RF-ICs and rapidly solve cross-domain integration problems.

The Agilent N5345A and N5346A active probing solutions with ultralow capacitive loading (less than 0.15 pF) and high sensitivity provide system insight with minimum disturbance at the gigabit speeds used in DigRF V4 testing. Users can choose between the N5345A mid-bus probe with soft touch technology for fast probing on prototype boards and N5346A flying leads probing solutions, which enable effortless monitoring of DigRF V4 links in space-constrained designs.

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